| Número de páginas: |
XVI, 928 p. 656 ilustraciones, 156 ilustraciones en color. |
| Nota de contenido: |
Introduction - Measurement Techniques and Applications -- Part I. Scanning Probe Microscopy: Scanning Probe Microscopy - Principle of Operation, Instrumentation and Probes -- Calibration of Normal and Lateral Forces in Cantilevers used in Atomic Force Microscopy -- Biomedical Sensing with the Atomic Force Microscope -- Part II. Nanomechanics: Nanomechanical Properties of Solid Surfaces and Thin Films -- Nanomechanical Properties of Nanostructures and Scale Effects -- Computer Simulations of Nanometer-Scale Indentation and Friction -- Part III. Nanotribology: Nanotribology, Nanomechanics, and Materials Characterization Studies Using Scanning Probe Microscopy -- Surface Forces and Nanorheology of Molecularly Thin Films -- Atomic Scale Friction Phenomena -- Scale Effect in Mechanical Properties and Tribology -- Part IV. Molecularly-Thick Films for Lubrication: Nanotribology of Ultrathin and Hard Amorphous Carbon Films -- Self-Assembled Monolayers for Controlling Adhesion, Friction, and Wear.-Nanoscale Boundary Lubrication Studies -- Part V. Industrial Applications: Micro/Nanotribology and Micro/Nanomechanics of Magnetic Storage Devices -- Nanotribology and Nanomechanics of MEMS/NEMS and BioMEMS/NEMS Materials and Devices. |
Nanotribology and Nanomechanics
